Please use this identifier to cite or link to this item: http://dx.doi.org/10.18419/opus-7950
Authors: Wunderlich, Hans-Joachim
Title: Protest: a tool for probabilistic testability analysis
Issue Date: 1985
metadata.ubs.publikation.typ: Konferenzbeitrag
metadata.ubs.publikation.source: Ofek, Hillel (Hrsg.): 22nd ACM/IEEE Design Automation Conference. Baltimore, Md. : Computer Soc. of the IEEE, 1985. - ISBN 0-8186-0635-5, S. 204-211. URL http://dx.doi.org./ 10.1109/DAC.1985.1585936
URI: http://nbn-resolving.de/urn:nbn:de:bsz:93-opus-73569
http://elib.uni-stuttgart.de/handle/11682/7967
http://dx.doi.org/10.18419/opus-7950
Abstract: The CAD-tool PROTEST (Probabilistlc Testability Analysis) is presented. PROTEST estimates for each fault of a combinational circuit its detection probability which can be used as a testability measure. Moreover it calculates the number of random test patterns which must be generated in order to achieve the required fault coverage. It is also demonstrated that the fault coverage will increase and the necesssry number of random patterns will drastically decrease, if each primary input is stimulated by test patterns having specific probabilities of being logical "1". PROTEST uses this fact and determines for each input the optimal signal probability for a randomly generated pattern.
Appears in Collections:15 Fakultätsübergreifend / Sonstige Einrichtung

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