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dc.contributor.authorBerroth, Manfredde
dc.contributor.authorBosch, Rolandde
dc.date.accessioned2014-05-21de
dc.date.accessioned2016-03-31T11:45:34Z-
dc.date.available2014-05-21de
dc.date.available2016-03-31T11:45:34Z-
dc.date.issued1990de
dc.identifier.other408359374de
dc.identifier.urihttp://nbn-resolving.de/urn:nbn:de:bsz:93-opus-92685de
dc.identifier.urihttp://elib.uni-stuttgart.de/handle/11682/8248-
dc.identifier.urihttp://dx.doi.org/10.18419/opus-8231-
dc.description.abstractFor the design of digital circuits as well as for power amplifiers, the nonlinear modelling of GaAs FETs is a necessity. We use an extended equivalent circuit, which takes into account the gate current of positive biased transistors as well as the symmetrical nature of the devices at low drain voltages. A fast method to determine the elements of the equivalent circuit from measured S-parameters is presented which delivers for the first time good agreement for all operating points. A valid large signal description of the device can be obtained by implementing the bias dependences of the intrinsic elements into a circuit simulator like SPICE.en
dc.language.isoende
dc.rightsinfo:eu-repo/semantics/openAccessde
dc.subject.classificationGalliumarsenid-Feldeffekttransistor , Hochfrequenzschaltung , MMICde
dc.subject.ddc621.3de
dc.titleHigh frequency equivalent circuit of GaAs depletion and enhancement FETs for large signal modellingen
dc.typeconferenceObjectde
ubs.fakultaetFakultätsübergreifend / Sonstige Einrichtungde
ubs.institutSonstige Einrichtungde
ubs.opusid9268de
ubs.publikation.sourceDigest of papers / Workshop on Measurement Techniques for Microwave Device Characterization and Modelling, Stuttgart, April 23, 1990. Stuttgart, 1990, S. 122-127de
ubs.publikation.typKonferenzbeitragde
Enthalten in den Sammlungen:15 Fakultätsübergreifend / Sonstige Einrichtung

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