Real-time displacement and tilt analysis by a speckle technique using Bi12SiO20-crystals

dc.contributor.author	Tiziani, Hans J.	de
dc.contributor.author	Leonhardt, Klaus	de
dc.contributor.author	Klenk, Jürgen	de
dc.date.accessioned	2011-02-21	de
dc.date.accessioned	2016-03-31T08:16:21Z
dc.date.available	2011-02-21	de
dc.date.available	2016-03-31T08:16:21Z
dc.date.issued	1980	de
dc.description.abstract	Storage of speckle pattern in real time by means of Bi12SiO20-crystals will be reported. Applying the double exposure technique, deformations, displacements as well as tilts can be analysed. The novel speckle technique displays the Young-interference fringes in quasi real time.	en
dc.identifier.other	346850924	de
dc.identifier.uri	http://nbn-resolving.de/urn:nbn:de:bsz:93-opus-60703	de
dc.identifier.uri	http://elib.uni-stuttgart.de/handle/11682/4321
dc.identifier.uri	http://dx.doi.org/10.18419/opus-4304
dc.language.iso	en	de
dc.rights	info:eu-repo/semantics/openAccess	de
dc.subject.classification	Speckle-Interferometrie	de
dc.subject.ddc	530	de
dc.title	Real-time displacement and tilt analysis by a speckle technique using Bi12SiO20-crystals	en
dc.type	article	de
ubs.fakultaet	Fakultät Konstruktions-, Produktions- und Fahrzeugtechnik	de
ubs.institut	Institut für Technische Optik	de
ubs.opusid	6070	de
ubs.publikation.source	Optics communications 34 (1980), S. 327-331. URL http://dx.doi.org./10.1016/0030-4018(80)90388-0	de
ubs.publikation.typ	Zeitschriftenartikel	de

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