Application of interferometry and holography for precision measurements

Tiziani, Hans J.

Application of interferometry and holography for precision measurements

dc.contributor.author	Tiziani, Hans J.	de
dc.date.accessioned	2011-02-22	de
dc.date.accessioned	2016-03-31T08:16:24Z
dc.date.available	2011-02-22	de
dc.date.available	2016-03-31T08:16:24Z
dc.date.issued	1984	de
dc.date.updated	2014-11-03	de
dc.description.abstract	Phase measurement techniques are becoming a useful tool for precision measurements. Spatial as well as temporal phase shift methods can be used. Optical testing, where computer analysis of interference fringes is becoming increasing important, will be discussed in connection with testing optical components, microprofiles as well as for testing aspheric surfaces. In addition, methods using heterodyne techniques and real time holography will be described.	en
dc.identifier.other	360699618	de
dc.identifier.uri	http://nbn-resolving.de/urn:nbn:de:bsz:93-opus-60856	de
dc.identifier.uri	http://elib.uni-stuttgart.de/handle/11682/4337
dc.identifier.uri	http://dx.doi.org/10.18419/opus-4320
dc.language.iso	en	de
dc.rights	info:eu-repo/semantics/openAccess	de
dc.subject.classification	Holographische Interferometrie , Optische Messtechnik	de
dc.subject.ddc	530	de
dc.title	Application of interferometry and holography for precision measurements	en
dc.type	conferenceObject	de
ubs.fakultaet	Fakultät Konstruktions-, Produktions- und Fahrzeugtechnik	de
ubs.institut	Institut für Technische Optik	de
ubs.opusid	6085	de
ubs.publikation.source	European Conference on Optics, Optical Systems and Applications 1984 : 9-12 Oct. 1984. Bellingham, Wash. : SPIE, 1985 (Proceedings of the SPIE 492). - ISBN 0-89252-527-4, S. 136-143	de
ubs.publikation.typ	Konferenzbeitrag	de

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