Micro shape and rough surface analysis by fringe projection

dc.contributor.authorLeonhardt, Klausde
dc.contributor.authorDroste, Ulrichde
dc.contributor.authorSchön, Stefande
dc.contributor.authorVoland, Christophde
dc.contributor.authorTiziani, Hans J.de
dc.date.accessioned2011-04-18de
dc.date.accessioned2016-03-31T08:16:44Z
dc.date.available2011-04-18de
dc.date.available2016-03-31T08:16:44Z
dc.date.issued1993de
dc.date.updated2012-06-27de
dc.description.abstractA new microscopic fringe projection system is described. Projection of the grating and imaging of the fringes is accomplished by the same objective. The spectrum of the binary grating is spatially filtered and projected into the aperture with a lateral shift. This leads to telecentric projection and imaging under oblique incidence. Topographies of specularely as well as diffusely reflecting surfaces can be obtained. The measurement of rough, technical surfaces is demonstrated.en
dc.identifier.other36735621Xde
dc.identifier.urihttp://nbn-resolving.de/urn:nbn:de:bsz:93-opus-62655de
dc.identifier.urihttp://elib.uni-stuttgart.de/handle/11682/4444
dc.identifier.urihttp://dx.doi.org/10.18419/opus-4427
dc.language.isoende
dc.rightsinfo:eu-repo/semantics/openAccessde
dc.subject.classificationOberflächenstruktur , Profil <Oberfläche>de
dc.subject.ddc620de
dc.titleMicro shape and rough surface analysis by fringe projectionen
dc.typeconferenceObjectde
ubs.fakultaetFakultät Konstruktions-, Produktions- und Fahrzeugtechnikde
ubs.institutInstitut für Technische Optikde
ubs.opusid6265de
ubs.publikation.sourceOptics as a key to high technology. T. 1. Bellingham, Wash. : SPIE, 1993 (Proceedings / SPIE 1983), S. 311-312de
ubs.publikation.typKonferenzbeitragde

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