Contouring by electronic speckle pattern interferometry with quadruple-beam illumination

dc.contributor.author	Zou, Yunlu	de
dc.contributor.author	Diao, Hongyan	de
dc.contributor.author	Peng, Xiang	de
dc.contributor.author	Tiziani, Hans J.	de
dc.date.accessioned	2011-03-21	de
dc.date.accessioned	2016-03-31T08:16:32Z
dc.date.available	2011-03-21	de
dc.date.available	2016-03-31T08:16:32Z
dc.date.issued	1992	de
dc.description.abstract	We present a new arrangement for contouring by electronic speckle pattern interferometry with four illumination beams, thereby making it unnecessary to move anything during the measurement.	en
dc.identifier.other	349257809	de
dc.identifier.uri	http://nbn-resolving.de/urn:nbn:de:bsz:93-opus-61699	de
dc.identifier.uri	http://elib.uni-stuttgart.de/handle/11682/4380
dc.identifier.uri	http://dx.doi.org/10.18419/opus-4363
dc.language.iso	en	de
dc.rights	info:eu-repo/semantics/openAccess	de
dc.subject.classification	Speckle-Interferometrie , Interferometrie , Mustererkennung	de
dc.subject.ddc	620	de
dc.title	Contouring by electronic speckle pattern interferometry with quadruple-beam illumination	en
dc.type	article	de
ubs.fakultaet	Fakultät Konstruktions-, Produktions- und Fahrzeugtechnik	de
ubs.institut	Institut für Technische Optik	de
ubs.opusid	6169	de
ubs.publikation.source	Applied optics 31 (1992), S. 6599-6602. URL http://dx.doi.org./10.1364/AO.31.006599	de
ubs.publikation.typ	Zeitschriftenartikel	de

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