Double pulse-electronic speckle interferometry (DP-ESPI)

Abstract

The double-pulsed speckle interferometry method is very much simpler than the double pulse holographic interferometry and allows a quick analysis of the interferograms without the development of films and hologram reconstructions. It is thus well suited to be used in an industrial environment. Using 3 cameras and three illumination directions (in order to have three sensitivi ty vectors) it is possible to measure 3-D deformations.