Contouring by electronic speckle pattern interferometry employing dual beam illumination
| dc.contributor.author | Joenathan, Charles | de |
| dc.contributor.author | Pfister, Berthold P. | de |
| dc.contributor.author | Tiziani, Hans J. | de |
| dc.date.accessioned | 2011-03-17 | de |
| dc.date.accessioned | 2016-03-31T08:16:29Z | |
| dc.date.available | 2011-03-17 | de |
| dc.date.available | 2016-03-31T08:16:29Z | |
| dc.date.issued | 1990 | de |
| dc.description.abstract | In this paper we extend and study the method for generating contours of diffuse objects employing a dual beam illumination coupled with electronic speckle pattern interferometry. The sensitivity and the orientation of the contour planes are analyzed. A novel method for tilting the planes of contours and experimental results incorporating phase shifting and fringe analysis are also presented. The theoretical and the experimental results show good agreement. | en |
| dc.identifier.other | 348964099 | de |
| dc.identifier.uri | http://nbn-resolving.de/urn:nbn:de:bsz:93-opus-61451 | de |
| dc.identifier.uri | http://elib.uni-stuttgart.de/handle/11682/4368 | |
| dc.identifier.uri | http://dx.doi.org/10.18419/opus-4351 | |
| dc.language.iso | en | de |
| dc.rights | info:eu-repo/semantics/openAccess | de |
| dc.subject.classification | Speckle-Interferometrie , Laser | de |
| dc.subject.ddc | 530 | de |
| dc.title | Contouring by electronic speckle pattern interferometry employing dual beam illumination | en |
| dc.type | article | de |
| ubs.fakultaet | Fakultät Konstruktions-, Produktions- und Fahrzeugtechnik | de |
| ubs.institut | Institut für Technische Optik | de |
| ubs.opusid | 6145 | de |
| ubs.publikation.source | Applied optics 29 (1990), S. 1905-1911. URL http://dx.doi.org./10.1364/AO.29.001905 | de |
| ubs.publikation.typ | Zeitschriftenartikel | de |