Double pulse-electronic speckle interferometry

Pedrini, Giancarlo; Tiziani, Hans J.

Double pulse-electronic speckle interferometry

dc.contributor.author	Pedrini, Giancarlo	de
dc.contributor.author	Tiziani, Hans J.	de
dc.date.accessioned	2011-04-01	de
dc.date.accessioned	2016-03-31T08:16:41Z
dc.date.available	2011-04-01	de
dc.date.available	2016-03-31T08:16:41Z
dc.date.issued	1994	de
dc.date.updated	2012-06-08	de
dc.description.abstract	The double-pulsed speckle interferometry method is very much simpler than the double pulse holographic interferometry and allows a quick analysis of the interferograms without the development of films and hologram reconstructions. It is thus well suited for industrial applications. The system can be extended to determine the three components of the deformation by illuminating the object from three directions and by observing with three cameras. Double-pulsed ESPI can be used to measure rotating objects with an optical derotator which compensates the rotation of the object optically.	en
dc.identifier.other	366495895	de
dc.identifier.uri	http://nbn-resolving.de/urn:nbn:de:bsz:93-opus-62179	de
dc.identifier.uri	http://elib.uni-stuttgart.de/handle/11682/4435
dc.identifier.uri	http://dx.doi.org/10.18419/opus-4418
dc.language.iso	en	de
dc.rights	info:eu-repo/semantics/openAccess	de
dc.subject.classification	Speckle-Interferometrie , Optische Messtechnik	de
dc.subject.ddc	620	de
dc.title	Double pulse-electronic speckle interferometry	en
dc.type	conferenceObject	de
ubs.fakultaet	Fakultät Konstruktions-, Produktions- und Fahrzeugtechnik	de
ubs.institut	Institut für Technische Optik	de
ubs.opusid	6217	de
ubs.publikation.source	Laser metrology for precision measurement and inspection in industry : 3. International IMEKO-Symposium, Heidelberg, March 21-22, 1994 / VDI-Gesellschaft Mess- und Automatisierungstechnik. Düsseldorf : VDI-Verl., 1994 (VDI-Berichte 1118). - ISBN 3-18-091118-2, S. 57-62	de
ubs.publikation.typ	Konferenzbeitrag	de

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