Remote nondestructive material analysis by photothermal interferometry

dc.contributor.authorSodnik, Zorande
dc.contributor.authorTiziani, Hans J.de
dc.date.accessioned2011-02-24de
dc.date.accessioned2016-03-31T08:16:24Z
dc.date.available2011-02-24de
dc.date.available2016-03-31T08:16:24Z
dc.date.issued1987de
dc.date.updated2014-11-03de
dc.description.abstractInterferometry is used for the detection of thermal waves to study material properties. A symmetrical interferometer as thermal expansion detector was developed for photothermal nondestructive material analysis. After mixing a phase shifted reference signal electrically to the interferometer signal, phase and amplitude exchange phenomena have been observed.en
dc.identifier.other366474413de
dc.identifier.urihttp://nbn-resolving.de/urn:nbn:de:bsz:93-opus-61011de
dc.identifier.urihttp://elib.uni-stuttgart.de/handle/11682/4341
dc.identifier.urihttp://dx.doi.org/10.18419/opus-4324
dc.language.isoende
dc.rightsinfo:eu-repo/semantics/openAccessde
dc.subject.classificationInterferometrie , Photothermische Methode , Zerstörungsfreie Werkstoffprüfungde
dc.subject.ddc530de
dc.titleRemote nondestructive material analysis by photothermal interferometryen
dc.typeconferenceObjectde
ubs.fakultaetFakultät Konstruktions-, Produktions- und Fahrzeugtechnikde
ubs.institutInstitut für Technische Optikde
ubs.opusid6101de
ubs.publikation.sourceEuropean Conference on Optics, Optical Systems and Applications 1986 : 30 Sept. - 3 Oct. 1986, Firenze, Italy. Bellingham, Wash. : SPIE, 1987 (Proceedings / SPIE 701). - ISBN 0-89252-736-6, S. 259-262de
ubs.publikation.typKonferenzbeitragde

Files

Original bundle

Now showing 1 - 1 of 1
Thumbnail Image
Name:
tiz57.pdf
Size:
1.23 MB
Format:
Adobe Portable Document Format

License bundle

Now showing 1 - 1 of 1
No Thumbnail Available
Name:
license.txt
Size:
1021 B
Format:
Plain Text
Description: