Optical methods for precision measurements

Tiziani, Hans J.

Optical methods for precision measurements

dc.contributor.author	Tiziani, Hans J.	de
dc.date.accessioned	2011-02-28	de
dc.date.accessioned	2016-03-31T08:16:29Z
dc.date.available	2011-02-28	de
dc.date.available	2016-03-31T08:16:29Z
dc.date.issued	1989	de
dc.description.abstract	Contactless measuring techniques are becoming increasingly important for industrial applications. The use of a laser, solid-state detector arrays and powerful small computers leads to a very efficient fringe analysis in holography as well as in Moiré and speckle techniques. Due to the computer analysis, much more information can be extracted from interferograms, leading to higher sensitivities and accuracies. The application of different fringe analysis procedures is discussed, together with some potentials of the application of interferometry, holography, and speckle and Moiré techniques.	en
dc.identifier.other	348948034	de
dc.identifier.uri	http://nbn-resolving.de/urn:nbn:de:bsz:93-opus-61219	de
dc.identifier.uri	http://elib.uni-stuttgart.de/handle/11682/4364
dc.identifier.uri	http://dx.doi.org/10.18419/opus-4347
dc.language.iso	en	de
dc.rights	info:eu-repo/semantics/openAccess	de
dc.subject.classification	Optische Messtechnik , Interferometrie	de
dc.subject.ddc	620	de
dc.title	Optical methods for precision measurements	en
dc.type	article	de
ubs.fakultaet	Fakultät Konstruktions-, Produktions- und Fahrzeugtechnik	de
ubs.institut	Institut für Technische Optik	de
ubs.opusid	6121	de
ubs.publikation.source	Optical and quantum electronics 21 (1989), S. 253-282. URL http://dx.doi.org./10.1007/BF02027299	de
ubs.publikation.typ	Zeitschriftenartikel	de

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