Oxidische FETs mit sub-100 nm Gatelänge

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Woltmann_Dissertation.pdf (12.6 MB)

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2016

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http://nbn-resolving.de/urn:nbn:de:bsz:93-opus-ds-88982
 http://elib.uni-stuttgart.de/handle/11682/8898
 http://dx.doi.org/10.18419/opus-8881

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08 Fakultät Mathematik und Physik

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