Two wavelength heterodyne absolute ranging technique using suppressed carrier modulation

dc.contributor.authorFischer, Edgarde
dc.contributor.authorDalhoff, Ernstde
dc.contributor.authorIttner, Thomasde
dc.contributor.authorKreuz, Silkede
dc.contributor.authorTiziani, Hans J.de
dc.date.accessioned2011-03-21de
dc.date.accessioned2016-03-31T08:16:36Z
dc.date.available2011-03-21de
dc.date.available2016-03-31T08:16:36Z
dc.date.issued1993de
dc.date.updated2012-06-14de
dc.description.abstractFor interferometric distance measurements on rough surfaces multiple wavelength interferometry is a powerful tool. It allows to reduce the sensitivity and to extend the range of unambiguity for interferometric measurement. A new kind of a double wavelength heterodyne interferometer is presented which uses only one laser source which generates two wavelengths λ 1 and λ 2 simultaneously. The two different heterodyne frequency shifts of the double heterodyne interferometer (DHI) are achieved by combining an acousto-optical modulator (driven in suppressed carrier mode) with a fixed diffraction grating. In a first prototype a multi-wavelength HeNe laser was used as light source. The synthetic wavelength λ in this system is 55.5 μm and the resolution about 0.15 μm. Measurement results obtained with the setup described are presented.en
dc.identifier.other366722484de
dc.identifier.urihttp://nbn-resolving.de/urn:nbn:de:bsz:93-opus-61828de
dc.identifier.urihttp://elib.uni-stuttgart.de/handle/11682/4408
dc.identifier.urihttp://dx.doi.org/10.18419/opus-4391
dc.language.isoende
dc.rightsinfo:eu-repo/semantics/openAccessde
dc.subject.classificationOptische Messtechnik , Heterodyninterferometriede
dc.subject.ddc620de
dc.titleTwo wavelength heterodyne absolute ranging technique using suppressed carrier modulationen
dc.typeconferenceObjectde
ubs.fakultaetFakultät Konstruktions-, Produktions- und Fahrzeugtechnikde
ubs.institutInstitut für Technische Optikde
ubs.opusid6182de
ubs.publikation.sourceOptics as a key to high technology. T. 2. Bellingham, Wash. : SPIE, 1993 (Proceedings / SPIE 1983), S. 692-693de
ubs.publikation.typKonferenzbeitragde

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