Interferometry for high resolution absolute distance measuring by larger distances

dc.contributor.authorDalhoff, Ernstde
dc.contributor.authorFischer, Edgarde
dc.contributor.authorKreuz, Silkede
dc.contributor.authorTiziani, Hans J.de
dc.date.accessioned2011-03-21de
dc.date.accessioned2016-03-31T08:16:36Z
dc.date.available2011-03-21de
dc.date.available2016-03-31T08:16:36Z
dc.date.issued1993de
dc.description.abstractAmong the incoherent techniques the phase measurement of modulated light seem to have reached some limitation with an resolution of less than 1 mm. This limitation is set by the bandwidth of the photodetector. The coherent techniques operate with two wavelengths to extend the unambiguity range of the classical interferometry. The unambiguity range is then half the synthetic wavelength and can be adjusted quite arbitrarily from some ten micrometers on. Among the incoherent techniques the phase measurement of modulated light seem to have reached some limitation with an resolution of less than 1 mm. This limitation is set by the bandwidth of the photodetector. The coherent techniques operate with two wavelengths to extend the unambiguity range of the classical interferometry. The unambiguity range is then half the synthetic wavelength and can be adjusted quite arbitrarily from some ten micrometers on.en
dc.identifier.other366716808de
dc.identifier.urihttp://nbn-resolving.de/urn:nbn:de:bsz:93-opus-61808de
dc.identifier.urihttp://elib.uni-stuttgart.de/handle/11682/4407
dc.identifier.urihttp://dx.doi.org/10.18419/opus-4390
dc.language.isoende
dc.rightsinfo:eu-repo/semantics/openAccessde
dc.subject.classificationElektrooptische Entfernungsmessung , Interferometriede
dc.subject.ddc620de
dc.titleInterferometry for high resolution absolute distance measuring by larger distancesen
dc.typeconferenceObjectde
ubs.fakultaetFakultät Konstruktions-, Produktions- und Fahrzeugtechnikde
ubs.institutInstitut für Technische Optikde
ubs.opusid6180de
ubs.publikation.sourceWaidelich, Wilhelm (Hrsg.): Laser in der Technik : Vorträge des 11. Internationalen Kongresses Laser 93. Berlin : Springer, 1994. - ISBN 3-540-57444-1, S. 248-251de
ubs.publikation.typKonferenzbeitragde

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