A unified method for assembling global test schedules

dc.contributor.authorStröle, Albrecht P.de
dc.contributor.authorWunderlich, Hans-Joachimde
dc.date.accessioned2012-04-18de
dc.date.accessioned2016-03-31T11:44:36Z
dc.date.available2012-04-18de
dc.date.available2016-03-31T11:44:36Z
dc.date.issued1994de
dc.date.updated2012-04-23de
dc.description.abstractIn order to make a register transfer structure testable, it is usually divided into functional blocks that can be tested independently by various test methods. The test patterns are shifted in or generated autonomously at the inputs of each block. The test responses of a block are compacted or observed at its output register. In this paper a unified method for assembling all the single tests to a global schedule is presented. It is compatible with a variety of different test methods. The described scheduling procedures reduce the overall test time and minimize the number of internal registers that have to be made directly observable.en
dc.identifier.other369582012de
dc.identifier.urihttp://nbn-resolving.de/urn:nbn:de:bsz:93-opus-72937de
dc.identifier.urihttp://elib.uni-stuttgart.de/handle/11682/7928
dc.identifier.urihttp://dx.doi.org/10.18419/opus-7911
dc.language.isoende
dc.rightsinfo:eu-repo/semantics/openAccessde
dc.subject.classificationPrüfprogramm , Selbsttestde
dc.subject.ddc621.3de
dc.titleA unified method for assembling global test schedulesen
dc.typeconferenceObjectde
ubs.fakultaetFakultätsübergreifend / Sonstige Einrichtungde
ubs.institutSonstige Einrichtungde
ubs.opusid7293de
ubs.publikation.sourceProceedings / Third Asian Test Symposium. Washington, DC : IEEE Computer Soc., 1994. - ISBN 0-8186-6690-0, S. 268-273. URL http://dx.doi.org./ 10.1109/ATS.1994.367220de
ubs.publikation.typKonferenzbeitragde

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