Browsing by Author "Groezinger, Tobias"

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    Development and validation of a novel setup for LEDs lifetime estimation on molded interconnect devices
    (2018) Soltani, Mahdi; Freyburger, Moritz; Kulkarni, Romit; Mohr, Rainer; Groezinger, Tobias; Zimmermann, André
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    ItemOpen Access
    A novel approach for reliability investigation of LEDs on molded interconnect devices based on FE-analysis coupled to injection molding simulation
    (2019) Soltani, Mahdi; Kulkarni, Romit; Scheinost, Tobias; Groezinger, Tobias; Zimmermann, André
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    ItemOpen Access
    Reliability study and thermal performance of LEDs on molded interconnect devices (MID) and PCB
    (2018) Soltani, Mahdi; Freyburger, Moritz; Kulkarni, Romit; Mohr, Rainer; Groezinger, Tobias; Zimmermann, André
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    ItemOpen Access
    Reliability study of electronic components on board-level packages encapsulated by thermoset injection molding
    (2020) Kulkarni, Romit; Soltani, Mahdi; Wappler, Peter; Guenther, Thomas; Fritz, Karl-Peter; Groezinger, Tobias; Zimmermann, André
    A drastically growing requirement of electronic packages with an increasing level of complexity poses newer challenges for the competitive manufacturing industry. Coupled with harsher operating conditions, these challenges affirm the need for encapsulated board-level (2nd level) packages. To reduce thermo-mechanical loads induced on the electronic components during operating cycles, a conformal type of encapsulation is gaining preference over conventional glob-tops or resin casting types. The availability of technology, the ease of automation, and the uncomplicated storage of raw material intensifies the implementation of thermoset injection molding for the encapsulation process of board-level packages. Reliability case studies of such encapsulated electronic components as a part of board-level packages become, thereupon, necessary. This paper presents the reliability study of exemplary electronic components, surface-mounted on printed circuit boards (PCBs), encapsulated by the means of thermoset injection molding, and subjected to cyclic thermal loading. The characteristic lifetime of the electronic components is statistically calculated after assessing the probability plots and presented consequently. A few points of conclusion are summarized, and the future scope is discussed at the end.