Browsing by Author "Kaufmann, Ekkehart"

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    Determination of average roughness and profile autocorrelation width of metallic surfaces with a white light sensor
    (1984) Leonhardt, Klaus; Kaufmann, Ekkehart; Tiziani, Hans J.
    A new procedure to determine simultaneously a horizontal descriptor of the surface - the autocorrelation width - and the most important vertical descriptor - the root-mean-square roughness - is presented. It is based on the inversion of an analytic contrast formula. After a short introduction to white light random phase contrast measurement we describe the elimination process and show first experimental verifications.