Determination of average roughness and profile autocorrelation width of metallic surfaces with a white light sensor

Abstract

A new procedure to determine simultaneously a horizontal descriptor of the surface - the autocorrelation width - and the most important vertical descriptor - the root-mean-square roughness - is presented. It is based on the inversion of an analytic contrast formula. After a short introduction to white light random phase contrast measurement we describe the elimination process and show first experimental verifications.