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Issue Date	Title	Author(s)
1989	Depth profiles of Ta2O5/SiO2/Si structures : a combined X-ray photoemission, Auger electron, and secondary ion mass spectroscopic study	Gimmel, Paul; Gompf, Bruno; Schmeißer, Dieter; Göpel, Wolfgang
1989	Ta2O5-gates of ph-sensitive devices : comparative spectroscopic and electrical studies	Gimmel, Paul; Gompf, Bruno; Schmeißer, Dieter; Wiemhöfer, Hans-Dieter; Göpel, Wolfgang; Klein, M.

Showing results 1 to 2 of 2