Polarized neutron reflectometry study of complex magnetism and hydrogen incorporation in thin-film structures

Abstract

In this thesis, we present the study of the structural and magnetic properties of simple metals and complex oxide thin films by means of polarized neutron reflectometry. The nuclear and electronic properties of thin films were modified via two routes, namely via hydrogen incorporation, in the case of niobium systems and complex oxide layers, and via depth modulated hole doping, in the case of manganite heterostructures.