Please use this identifier to cite or link to this item: http://dx.doi.org/10.18419/opus-4304
Authors: Tiziani, Hans J.
Leonhardt, Klaus
Klenk, Jürgen
Title: Real-time displacement and tilt analysis by a speckle technique using Bi12SiO20-crystals
Issue Date: 1980
metadata.ubs.publikation.typ: Zeitschriftenartikel
metadata.ubs.publikation.source: Optics communications 34 (1980), S. 327-331. URL http://dx.doi.org./10.1016/0030-4018(80)90388-0
URI: http://nbn-resolving.de/urn:nbn:de:bsz:93-opus-60703
http://elib.uni-stuttgart.de/handle/11682/4321
http://dx.doi.org/10.18419/opus-4304
Abstract: Storage of speckle pattern in real time by means of Bi12SiO20-crystals will be reported. Applying the double exposure technique, deformations, displacements as well as tilts can be analysed. The novel speckle technique displays the Young-interference fringes in quasi real time.
Appears in Collections:07 Fakultät Konstruktions-, Produktions- und Fahrzeugtechnik

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