Please use this identifier to cite or link to this item: http://dx.doi.org/10.18419/opus-4320
Authors: Tiziani, Hans J.
Title: Application of interferometry and holography for precision measurements
Issue Date: 1984
metadata.ubs.publikation.typ: Konferenzbeitrag
metadata.ubs.publikation.source: European Conference on Optics, Optical Systems and Applications 1984 : 9-12 Oct. 1984. Bellingham, Wash. : SPIE, 1985 (Proceedings of the SPIE 492). - ISBN 0-89252-527-4, S. 136-143
URI: http://nbn-resolving.de/urn:nbn:de:bsz:93-opus-60856
http://elib.uni-stuttgart.de/handle/11682/4337
http://dx.doi.org/10.18419/opus-4320
Abstract: Phase measurement techniques are becoming a useful tool for precision measurements. Spatial as well as temporal phase shift methods can be used. Optical testing, where computer analysis of interference fringes is becoming increasing important, will be discussed in connection with testing optical components, microprofiles as well as for testing aspheric surfaces. In addition, methods using heterodyne techniques and real time holography will be described.
Appears in Collections:07 Fakultät Konstruktions-, Produktions- und Fahrzeugtechnik

Files in This Item:
File Description SizeFormat 
tiz41.pdf1,42 MBAdobe PDFView/Open


Items in OPUS are protected by copyright, with all rights reserved, unless otherwise indicated.