Please use this identifier to cite or link to this item: http://dx.doi.org/10.18419/opus-4347
|Authors:||Tiziani, Hans J.|
|Title:||Optical methods for precision measurements|
|metadata.ubs.publikation.source:||Optical and quantum electronics 21 (1989), S. 253-282. URL http://dx.doi.org./10.1007/BF02027299|
|Abstract:||Contactless measuring techniques are becoming increasingly important for industrial applications. The use of a laser, solid-state detector arrays and powerful small computers leads to a very efficient fringe analysis in holography as well as in Moiré and speckle techniques. Due to the computer analysis, much more information can be extracted from interferograms, leading to higher sensitivities and accuracies. The application of different fringe analysis procedures is discussed, together with some potentials of the application of interferometry, holography, and speckle and Moiré techniques.|
|Appears in Collections:||07 Fakultät Konstruktions-, Produktions- und Fahrzeugtechnik|
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