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Authors: Joenathan, Charles
Pfister, Berthold P.
Tiziani, Hans J.
Title: Contouring by electronic speckle pattern interferometry employing dual beam illumination
Issue Date: 1990 Zeitschriftenartikel Applied optics 29 (1990), S. 1905-1911. URL
Abstract: In this paper we extend and study the method for generating contours of diffuse objects employing a dual beam illumination coupled with electronic speckle pattern interferometry. The sensitivity and the orientation of the contour planes are analyzed. A novel method for tilting the planes of contours and experimental results incorporating phase shifting and fringe analysis are also presented. The theoretical and the experimental results show good agreement.
Appears in Collections:07 Fakultät Konstruktions-, Produktions- und Fahrzeugtechnik

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