Please use this identifier to cite or link to this item: http://dx.doi.org/10.18419/opus-4351
Authors: Joenathan, Charles
Pfister, Berthold P.
Tiziani, Hans J.
Title: Contouring by electronic speckle pattern interferometry employing dual beam illumination
Issue Date: 1990
metadata.ubs.publikation.typ: Zeitschriftenartikel
metadata.ubs.publikation.source: Applied optics 29 (1990), S. 1905-1911. URL http://dx.doi.org./10.1364/AO.29.001905
URI: http://nbn-resolving.de/urn:nbn:de:bsz:93-opus-61451
http://elib.uni-stuttgart.de/handle/11682/4368
http://dx.doi.org/10.18419/opus-4351
Abstract: In this paper we extend and study the method for generating contours of diffuse objects employing a dual beam illumination coupled with electronic speckle pattern interferometry. The sensitivity and the orientation of the contour planes are analyzed. A novel method for tilting the planes of contours and experimental results incorporating phase shifting and fringe analysis are also presented. The theoretical and the experimental results show good agreement.
Appears in Collections:07 Fakultät Konstruktions-, Produktions- und Fahrzeugtechnik

Files in This Item:
File Description SizeFormat 
tiz90.pdf1,27 MBAdobe PDFView/Open


Items in OPUS are protected by copyright, with all rights reserved, unless otherwise indicated.