Please use this identifier to cite or link to this item: http://dx.doi.org/10.18419/opus-4394
Authors: Pedrini, Giancarlo
Tiziani, Hans J.
Title: Double pulse-electronic speckle interferometry (DP-ESPI)
Issue Date: 1993
metadata.ubs.publikation.typ: Konferenzbeitrag
metadata.ubs.publikation.source: Waidelich, Wilhelm (Hrsg.): Laser in der Technik : Vorträge des 11. Internationalen Kongresses Laser 93. Berlin : Springer, 1994. - ISBN 3-540-57444-1, S. 162-165
URI: http://nbn-resolving.de/urn:nbn:de:bsz:93-opus-61945
http://elib.uni-stuttgart.de/handle/11682/4411
http://dx.doi.org/10.18419/opus-4394
Abstract: The double-pulsed speckle interferometry method is very much simpler than the double pulse holographic interferometry and allows a quick analysis of the interferograms without the development of films and hologram reconstructions. It is thus well suited to be used in an industrial environment. Using 3 cameras and three illumination directions (in order to have three sensitivi ty vectors) it is possible to measure 3-D deformations.
Appears in Collections:07 Fakultät Konstruktions-, Produktions- und Fahrzeugtechnik

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