Please use this identifier to cite or link to this item: http://dx.doi.org/10.18419/opus-4418
Authors: Pedrini, Giancarlo
Tiziani, Hans J.
Title: Double pulse-electronic speckle interferometry
Issue Date: 1994
metadata.ubs.publikation.typ: Konferenzbeitrag
metadata.ubs.publikation.source: Laser metrology for precision measurement and inspection in industry : 3. International IMEKO-Symposium, Heidelberg, March 21-22, 1994 / VDI-Gesellschaft Mess- und Automatisierungstechnik. Düsseldorf : VDI-Verl., 1994 (VDI-Berichte 1118). - ISBN 3-18-091118-2, S. 57-62
URI: http://nbn-resolving.de/urn:nbn:de:bsz:93-opus-62179
http://elib.uni-stuttgart.de/handle/11682/4435
http://dx.doi.org/10.18419/opus-4418
Abstract: The double-pulsed speckle interferometry method is very much simpler than the double pulse holographic interferometry and allows a quick analysis of the interferograms without the development of films and hologram reconstructions. It is thus well suited for industrial applications. The system can be extended to determine the three components of the deformation by illuminating the object from three directions and by observing with three cameras. Double-pulsed ESPI can be used to measure rotating objects with an optical derotator which compensates the rotation of the object optically.
Appears in Collections:07 Fakultät Konstruktions-, Produktions- und Fahrzeugtechnik

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