Please use this identifier to cite or link to this item: http://dx.doi.org/10.18419/opus-4962
|Title:||Dynamics of polarization growth and reversal in PVDF films|
|metadata.ubs.publikation.source:||IEEE transactions on electrical insulation 24 (1989), S. 461-468. URL http://dx.doi.org./10.1109/14.30890|
|Abstract:||Measurements are presented of the time development of the dielectric displacement and the remanent polarization in polyvinylidene fluoride (PVDF) for poling times ranging from 1 μs to 1000 s and poling fields between 0.8 and 2.0 MV/cm. For longer times (0.1 to 1000 s), the time dependence of the polarization distribution across the film thickness is also determined. After application of a steep rectangular high-voltage pulse, the sample is shorted to zero voltage. The remanent polarization under the short-circuit conditions is compared to the maximum dielectric displacement under the external poling field. A significant time delay of the buildup of the remanent polarization was observed as compared to the dielectric displacement under field. This time delay depends significantly on the applied field strength and the crystallinity of the films. In the case of polarization reversal, a flipping back' of the polarization was observed for shorter poling times of up to 200 μs. Under these conditions, a large part of the polarization is reversed under the field, but after the removal of the field, most of the polarization returns to the original direction. The results can be explained by the ferroelectric cooperative coupling of oriented crystallite dipoles to charges trapped at the surface of polarized crystallites.|
|Appears in Collections:||08 Fakultät Mathematik und Physik|
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