Please use this identifier to cite or link to this item: http://dx.doi.org/10.18419/opus-5185
Emrick, Roy M.
|Title:||Ion channeling in T-phase quasicrystals: an investigation by Rutherford backscattering and particle induced X-ray emission|
|metadata.ubs.publikation.source:||Nuclear instruments & methods in physics research, B 67 (1992), S. 173-179. URL http://dx.doi.org./10.1016/0168-583X(92)95796-T|
|Abstract:||The channeling properties of a T-phase A1 62Cu 20Co 15Si 3 quasicrystal are investigated in a Rutherford backscattering study employing 2 MeV He-ions. Besides axial channeling along the decagonal axis, also planar channeling is observed in planes having the decagonal axis in common and showing the decagonal symmetry of the quasicrystal. Besides a system of main planes, various planes exhibiting only weak channeling properties are observed; they correspond to linear arrangements of vertices in a two-dimensional Penrose grid, demonstrating the close relationship between T-phase quasicrystal and Penrose pattern. Rutherford backscattering (RBS) has also been used to study the decoration of the T-phase structure by Co/Cu- and Al/Si-atoms; in addition, particle induced X-ray emission PIXE served to distinguish between Co- and Cu-atoms. The experimental data are compared with channeling computer simulations on a model T-phase quasicrystal proposed by Steurer and Kuo.|
|Appears in Collections:||08 Fakultät Mathematik und Physik|
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