Please use this identifier to cite or link to this item: http://dx.doi.org/10.18419/opus-7926
Authors: Hellebrand, Sybille
Wunderlich, Hans-Joachim
Title: Tools and devices supporting the pseudo-exhaustive test
Issue Date: 1990
metadata.ubs.publikation.typ: Konferenzbeitrag
metadata.ubs.publikation.source: The proceedings of the European Design Automation Conference. Washington, DC : IEEE Computer Soc. Pr., 1990. - ISBN 0-8186-2024-2, S. 13-17. URL http://dx.doi.org./ 10.1109/EDAC.1990.136612
URI: http://nbn-resolving.de/urn:nbn:de:bsz:93-opus-73219
http://elib.uni-stuttgart.de/handle/11682/7943
http://dx.doi.org/10.18419/opus-7926
Abstract: In the paper logical cells and algorithms are presented supporting the design of pseudo-exhaustively testable circuits. The approach is based on real hardware segmentation, instead of path-sensitizing. The developed cells segment the entire circuits into exhaustively testable parts, and the presented algorithms place these cells, under the objective to minimize the hardware overhead. The approach is completely compatible with the usual LSSD-rules. The analysis of the well-known benchmark circuits shows only little additional hardware costs.
Appears in Collections:15 Fakultätsübergreifend / Sonstige Einrichtung

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