Please use this identifier to cite or link to this item: http://dx.doi.org/10.18419/opus-7939
|Title:||Multiple distributions for biased random test patterns|
|metadata.ubs.publikation.source:||New frontiers in testing : proceedings. Washington, DC : IEEE Computer Soc. Pr., 1988. - ISBN 0-8186-0870-6, S. 236-244. URL http://dx.doi.org./10.1109/TEST.1988.207808|
|Abstract:||An efficient method has been presented to compute multiple distributions for random patterns, which can be applied successively. Using multiple distributions, all combinational circuits can be made random-testable, and complete fault coverage is provided by a few thousands of random patterns. The differently weighted random test sets can be applied to scan path circuits using an external chip, combining the advantages of a low cost test and of high fault coverage. Several facts about testing by random patterns have been proven. It has been shown that the number of random patterns required for a certain fault coverage can be computed without regarding the pseudorandom property and with the independence assumption for fault detection.|
|Appears in Collections:||15 Fakultätsübergreifend / Sonstige Einrichtung|
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