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Authors: Wunderlich, Hans-Joachim
Hellebrand, Sybille
Title: Generating pattern sequences for the pseudo-exhaustive test of MOS-circuits
Issue Date: 1988 Konferenzbeitrag Digest of papers / the Eighteenth International Symposium on Fault-Tolerant Computing, FTCS-18, June 27-30, 1988, Keio Plaza Hotel, Tokyo. Piscataway, NJ : IEEE Service Center, 1988. - ISBN 0-8186-0867-6, S. 36-41. URL
Abstract: A method based on linear feedback shift registers over finite fields is presented to generate for a natural number n a pattern sequence with minimal length detecting each m-multiple stuck-open faults for M≤n. A hardware architecture is discussed generating this sequence, and for n=1 a built-in self-test (BIST) approach is presented that detects all combinations of multiple combinational and single stuck-open faults. The sequences are of minimum length, and can be produced either by software, by an external chip, or be a BIST-structure. Using the latter, the hardware overhead would be of the same magnitude as a conventional pseudorandom architecture.
Appears in Collections:15 Fakultätsübergreifend / Sonstige Einrichtung

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