Please use this identifier to cite or link to this item: http://dx.doi.org/10.18419/opus-7945
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dc.contributor.authorWunderlich, Hans-Joachimde
dc.date.accessioned2012-05-04de
dc.date.accessioned2016-03-31T11:44:43Z-
dc.date.available2012-05-04de
dc.date.available2016-03-31T11:44:43Z-
dc.date.issued1987de
dc.identifier.other370155173de
dc.identifier.urihttp://nbn-resolving.de/urn:nbn:de:bsz:93-opus-73511de
dc.identifier.urihttp://elib.uni-stuttgart.de/handle/11682/7962-
dc.identifier.urihttp://dx.doi.org/10.18419/opus-7945-
dc.description.abstractSelf testing of integrated circuits by random patterns has several technical and economical advantages. But there exists a large number of circuits which cannot be randomly tested, since the fault coverage achieved that way would be too low. In this paper we show that this problem can be solved by unequiprobable random patterns, and an efficient procedure is presented computing the specific optimal probability for each primary input of a combinational network. Those optimized random patterns can be produced on the chip during self test or off the chip in order to accelerate fault simulation and test pattern generation.en
dc.language.isoende
dc.rightsinfo:eu-repo/semantics/openAccessde
dc.subject.classificationSelbsttest , Fehlermodell , Integrierte Schaltungde
dc.subject.ddc621.3de
dc.titleOn computing optimized input probabilities for random testsen
dc.typeconferenceObjectde
ubs.fakultaetFakultätsübergreifend / Sonstige Einrichtungde
ubs.institutSonstige Einrichtungde
ubs.opusid7351de
ubs.publikation.sourceNeill, Lawrence A. O. (Hrsg.): 24rd ACM/IEEE Design Automation Conference : proceedings 1987. Baltimore, Md. : ACM, 1987. - ISBN 0-8186-0781-5, S. 392-398. URL http://dx.doi.org./ 10.1109/DAC.1987.203273de
ubs.publikation.typKonferenzbeitragde
Appears in Collections:15 Fakultätsübergreifend / Sonstige Einrichtung

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