Structural and electronic properties of nickelate heterostructures

Abstract

The fabrication of thin films and multilayers has led to the discovery of novel functional properties which are widely used in electronic devices nowadays. The limit of such a material design is atomic layer-by-layer deposition which was made possible through shuttered molecular beam epitaxy (MBE) growth. In the course of this thesis project a newly developed oxide MBE system was used to grow two different types of nickelate heterostructures, namely superlattices (SLs) consisting of metallic and paramagnetic LaNiO3 sandwiched between a large band-gap insulator and a combination of lanthanum nickelate and cuprate layers into a single hybrid structure. The former type was intensively studied in the last years and a transition to a weakly insulating, antiferromagnetically ordered state was observed in samples where the LaNiO3 thickness had been reduced to only two unit cells. So far little was known about the influence of the growth method on the defects in the samples and consequently on their physical properties. The use of oxide MBE enabled us to improve the overall sample quality of nickelate SLs and to design a novel material. We first optimized the growth of LaNiO3 and thoroughly analyzed the heterostructures by synchrotron-based x-ray diffraction, transmission electron microscopy, and temperature-dependent electrical resistivity. Furthermore we conducted in-depth studies, including x-ray absorption and magneto-transport measurements. The knowledge gained thereby was used grow new, layered nickelate-cuprate hybrid structures with novel electronic and magnetic properties.