Reflection of high frequency phonons at free silicon surfaces

dc.contributor.author	Marx, Dieter	de
dc.contributor.author	Buck, Jochen	de
dc.contributor.author	Lassmann, Kurt	de
dc.contributor.author	Eisenmenger, Wolfgang	de
dc.date.accessioned	2009-10-07	de
dc.date.accessioned	2016-03-31T08:35:51Z
dc.date.available	2009-10-07	de
dc.date.available	2016-03-31T08:35:51Z
dc.date.issued	1978	de
dc.date.updated	2014-09-11	de
dc.description.abstract	In reflection experiments at free silicon [100]-surfaces we could distinguish between specularly and diffusely reflected transverse phonons propagated along <100>-directions. With increasing phonon frequency the number of diffusely scattered phonons increase relative to that of specularly reflected phonons.	en
dc.identifier.other	317914251	de
dc.identifier.uri	http://nbn-resolving.de/urn:nbn:de:bsz:93-opus-46898	de
dc.identifier.uri	http://elib.uni-stuttgart.de/handle/11682/4904
dc.identifier.uri	http://dx.doi.org/10.18419/opus-4887
dc.language.iso	en	de
dc.rights	info:eu-repo/semantics/openAccess	de
dc.subject.classification	Phonon , Silicium	de
dc.subject.ddc	530	de
dc.title	Reflection of high frequency phonons at free silicon surfaces	en
dc.type	article	de
ubs.fakultaet	Fakultät Mathematik und Physik	de
ubs.institut	1. Physikalisches Institut	de
ubs.opusid	4689	de
ubs.publikation.source	Journal de physique 39 (1978), C6, S. 1015-1016	de
ubs.publikation.typ	Zeitschriftenartikel	de

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