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  4. Modeling and investigating total ionizing dose impact on FeFET
 

Modeling and investigating total ionizing dose impact on FeFET

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JXCDC.2023.3325706.pdf (774.1 KB)

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2023

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Sayed, Munazza
Ni, Kai
Amrouch, Hussam

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http://nbn-resolving.de/urn:nbn:de:bsz:93-opus-ds-146047
http://elib.uni-stuttgart.de/handle/11682/14604
http://dx.doi.org/10.18419/opus-14585

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05 Fakultät Informatik, Elektrotechnik und Informationstechnik

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info:eu-repo/semantics/openAccess
Except where otherwised noted, this item's license is described as info:eu-repo/semantics/openAccess
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