Determination of average roughness and profile autocorrelation width of metallic surfaces with a white light sensor
| dc.contributor.author | Leonhardt, Klaus | de |
| dc.contributor.author | Kaufmann, Ekkehart | de |
| dc.contributor.author | Tiziani, Hans J. | de |
| dc.date.accessioned | 2011-02-22 | de |
| dc.date.accessioned | 2016-03-31T08:16:22Z | |
| dc.date.available | 2011-02-22 | de |
| dc.date.available | 2016-03-31T08:16:22Z | |
| dc.date.issued | 1984 | de |
| dc.description.abstract | A new procedure to determine simultaneously a horizontal descriptor of the surface - the autocorrelation width - and the most important vertical descriptor - the root-mean-square roughness - is presented. It is based on the inversion of an analytic contrast formula. After a short introduction to white light random phase contrast measurement we describe the elimination process and show first experimental verifications. | en |
| dc.identifier.other | 346984521 | de |
| dc.identifier.uri | http://nbn-resolving.de/urn:nbn:de:bsz:93-opus-60879 | de |
| dc.identifier.uri | http://elib.uni-stuttgart.de/handle/11682/4330 | |
| dc.identifier.uri | http://dx.doi.org/10.18419/opus-4313 | |
| dc.language.iso | en | de |
| dc.rights | info:eu-repo/semantics/openAccess | de |
| dc.subject.classification | Speckle-Interferometrie , Profil <Oberfläche> | de |
| dc.subject.ddc | 530 | de |
| dc.title | Determination of average roughness and profile autocorrelation width of metallic surfaces with a white light sensor | en |
| dc.type | article | de |
| ubs.fakultaet | Fakultät Konstruktions-, Produktions- und Fahrzeugtechnik | de |
| ubs.fakultaet | Fakultätsübergreifend / Sonstige Einrichtung | de |
| ubs.institut | Institut für Technische Optik | de |
| ubs.institut | Sonstige Einrichtung | de |
| ubs.opusid | 6087 | de |
| ubs.publikation.source | Optics communications 51 (1984), S. 363-367. URL http://dx.doi.org./10.1016/0030-4018(84)90117-2 | de |
| ubs.publikation.typ | Zeitschriftenartikel | de |