Ultrasonic spectroscopy of the acceptor ground state in cubic semiconductors

dc.contributor.author	Lassmann, Kurt	de
dc.contributor.author	Zeile, Heinrich	de
dc.date.accessioned	2009-10-07	de
dc.date.accessioned	2016-03-31T08:35:49Z
dc.date.available	2009-10-07	de
dc.date.available	2016-03-31T08:35:49Z
dc.date.issued	1980	de
dc.date.updated	2014-10-27	de
dc.description.abstract	In the following we will discuss ultrasonic measurements on p-type semiconductors reflecting spontaneous and defect sensitive modifications of the acceptor ground state.	en
dc.identifier.other	31789773X	de
dc.identifier.uri	http://nbn-resolving.de/urn:nbn:de:bsz:93-opus-46901	de
dc.identifier.uri	http://elib.uni-stuttgart.de/handle/11682/4893
dc.identifier.uri	http://dx.doi.org/10.18419/opus-4876
dc.language.iso	en	de
dc.rights	info:eu-repo/semantics/openAccess	de
dc.subject.classification	Ultraschallspektroskopie , Halbleiter , Akzeptor <Halbleiterphysik>	de
dc.subject.ddc	530	de
dc.title	Ultrasonic spectroscopy of the acceptor ground state in cubic semiconductors	en
dc.type	conferenceObject	de
ubs.fakultaet	Fakultät Mathematik und Physik	de
ubs.institut	1. Physikalisches Institut	de
ubs.opusid	4690	de
ubs.publikation.source	Maris, Humphrey J. (Hrsg.): Phonon scattering in condensed matter : proceedings of the third international conference. New York : Plenum Press, 1980. - ISBN 0-306-40355-2, S. 369-376	de
ubs.publikation.typ	Konferenzbeitrag	de

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