Self test using unequiprobable random patterns

dc.contributor.author	Wunderlich, Hans-Joachim	de
dc.date.accessioned	2012-05-04	de
dc.date.accessioned	2016-03-31T11:44:43Z
dc.date.available	2012-05-04	de
dc.date.available	2016-03-31T11:44:43Z
dc.date.issued	1987	de
dc.description.abstract	In this paper we present a module generating unequiprobable random patterns, which can also perform signature analysis and work like a normal register similar to the well known BILBO. The hardware overhead of this module has the same magnitude as a conventional BILBO. Thus the class of self testable circuits is enlarged without additional costs.	en
dc.identifier.other	370155300	de
dc.identifier.uri	http://nbn-resolving.de/urn:nbn:de:bsz:93-opus-73527	de
dc.identifier.uri	http://elib.uni-stuttgart.de/handle/11682/7963
dc.identifier.uri	http://dx.doi.org/10.18419/opus-7946
dc.language.iso	en	de
dc.rights	info:eu-repo/semantics/openAccess	de
dc.subject.classification	Selbsttest , Fehlererkennung , Integrierte Schaltung	de
dc.subject.ddc	621.3	de
dc.title	Self test using unequiprobable random patterns	en
dc.type	conferenceObject	de
ubs.fakultaet	Fakultätsübergreifend / Sonstige Einrichtung	de
ubs.institut	Sonstige Einrichtung	de
ubs.opusid	7352	de
ubs.publikation.source	Digest of papers / the Seventeenth International Symposium on Fault-Tolerant Computing. Washington, DC : Computer Soc. of the IEEE, 1987. - ISBN 0-8186-0778-5, S. 258-263	de
ubs.publikation.typ	Konferenzbeitrag	de

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