Maximizing the fault coverage in complex circuits by minimal number of signatures
| dc.contributor.author | Wunderlich, Hans-Joachim | de |
| dc.contributor.author | Ströle, Albrecht P. | de |
| dc.date.accessioned | 2012-04-18 | de |
| dc.date.accessioned | 2016-03-31T11:44:36Z | |
| dc.date.available | 2012-04-18 | de |
| dc.date.available | 2016-03-31T11:44:36Z | |
| dc.date.issued | 1991 | de |
| dc.description.abstract | Methods to minimize the number of evaluated signatures without reducing the fault coverage are presented. This is possible because the signatures can influence one another during the test execution. For a fixed test schedule a minimal subset of signatures can be selected, and for a predetermined minimal subset of signatures the test schedule can be constructed such that the fault coverage is maximum. Both approaches result in significant hardware savings when a self-test is implemented. | en |
| dc.identifier.other | 369510283 | de |
| dc.identifier.uri | http://nbn-resolving.de/urn:nbn:de:bsz:93-opus-73115 | de |
| dc.identifier.uri | http://elib.uni-stuttgart.de/handle/11682/7925 | |
| dc.identifier.uri | http://dx.doi.org/10.18419/opus-7908 | |
| dc.language.iso | en | de |
| dc.rights | info:eu-repo/semantics/openAccess | de |
| dc.subject.classification | Fehlererkennung , Selbsttest , Signaturanalyse | de |
| dc.subject.ddc | 621.3 | de |
| dc.title | Maximizing the fault coverage in complex circuits by minimal number of signatures | en |
| dc.type | conferenceObject | de |
| ubs.fakultaet | Fakultätsübergreifend / Sonstige Einrichtung | de |
| ubs.institut | Sonstige Einrichtung | de |
| ubs.opusid | 7311 | de |
| ubs.publikation.source | 1991 IEEE International Symposium on Circuits and Systems. Vol. 3 : Analog, circuits and neural networks. Piscataway, NJ : IEEE, 1991. - ISBN 0-7803-0050-5, S. 1881-1884 | de |
| ubs.publikation.typ | Konferenzbeitrag | de |