Phonon scattering due to deep acceptors in semiconductors

dc.contributor.authorCombarieu, Andre dede
dc.contributor.authorLassmann, Kurtde
dc.date.accessioned2009-10-07de
dc.date.accessioned2016-03-31T08:35:50Z
dc.date.available2009-10-07de
dc.date.available2016-03-31T08:35:50Z
dc.date.issued1976de
dc.date.updated2014-10-27de
dc.description.abstractWe have measured the magnetothermal conductivity in GaAs(Mn) and Si(In) for temperatures between 1.4 K and 90 K at magnetic fields up to 8 T. In both cases the dopants are deep acceptors with binding energy much larger (110 meV and 165 meV respectively) than given by the effective mass theory (~ 35 meV). There is a double interest in such systems: First, an excited level 3 meV (4.2 meV) above the acceptor ground state has been concluded from ultrasonic measurements. Such an excited state might be connected with a Jahn-Teller effect of these deeper acceptors and should be seen by resonant phonon scattering in thermal conductivity. Second, an anomalous behavior of the magnetothermal conductivity has been found for shallowacceptors in Ge (but not in Si) making comparison with systems with different g-factors desirable. The g-factors of acceptors in GaAs are roughly three times, the g-factor of Si(In) about 0.6 times that of Si(B).en
dc.identifier.other317912690de
dc.identifier.urihttp://nbn-resolving.de/urn:nbn:de:bsz:93-opus-46841de
dc.identifier.urihttp://elib.uni-stuttgart.de/handle/11682/4901
dc.identifier.urihttp://dx.doi.org/10.18419/opus-4884
dc.language.isoende
dc.rightsinfo:eu-repo/semantics/openAccessde
dc.subject.classificationPhononenemission , Halbleiter , Akzeptor <Halbleiterphysik>de
dc.subject.ddc530de
dc.titlePhonon scattering due to deep acceptors in semiconductorsen
dc.typeconferenceObjectde
ubs.fakultaetFakultät Mathematik und Physikde
ubs.fakultaetFakultätsübergreifend / Sonstige Einrichtungde
ubs.institut1. Physikalisches Institutde
ubs.institutSonstige Einrichtungde
ubs.opusid4684de
ubs.publikation.sourceChallis, Lawrence J. (Hrsg.): Phonon scattering in solids : proceedings of the Second International Conference on Phonon Scattering in Solids held at the University of Nottingham, August 27-30, 1975. New York : Plenum Press, 1976, S. 340-342de
ubs.publikation.typKonferenzbeitragde

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