07 Fakultät Konstruktions-, Produktions- und Fahrzeugtechnik
Permanent URI for this collectionhttps://elib.uni-stuttgart.de/handle/11682/8
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Item Open Access Application of interferometry and holography for precision measurements(1984) Tiziani, Hans J.Phase measurement techniques are becoming a useful tool for precision measurements. Spatial as well as temporal phase shift methods can be used. Optical testing, where computer analysis of interference fringes is becoming increasing important, will be discussed in connection with testing optical components, microprofiles as well as for testing aspheric surfaces. In addition, methods using heterodyne techniques and real time holography will be described.Item Open Access Testing of aspheric surfaces with computer generated holograms(1988) Tiziani, Hans J.; Packroß, Bernd; Schmidt, GerhardAspherical surfaces are becoming more important and can even be mass producted. There is a need for flexible test methods of high accuracy. The paper describes the combination of a computer generated holograms with a partially compensating lens as a powerful tool. An example for testing a steep aspheric surface will be given.Item Open Access High precision laser supported close range distance measurements(1992) Tiziani, Hans J.Optical methods become useful tools for dimensional measurements. Methods based on triangulation, time of flight, phase measurements and interferometry are used and will be further developed. Multiple wavelength interferometry allows the reduction of the sensitivity by a range extension leading to robust measuring systems. Superheterodyne interferometric techniques based on two wavelength heterodyne interferometry will also be discussed and experimental results will be shown.Item Open Access Mikro-Profilometrie zur Bestimmung der Topographie und Rauheit technischer Oberflächen mittels Heterodyn-Laserinterferometrie(1989) Leonhardt, Klaus; Rippert, Karl-Heinz; Tiziani, Hans J.Ein Heterodyn-Profilometer zur Messung der Rauheit polierter und feingeschliffener Oberflächen und zur Formmessung wird beschrieben. Die Vertikal- oder Höhenauflösung liegt bei 0,5 nm, der Meßbereich für Formmessungen an glatten Oberflächen bei 40 pm bei einer maximalen Abtastlänge von 300 mm. Die Lateralauflösung kann je nach Aperturausleuchtung bis zu 0,5 pm eingestellt werden. Anwendungen und Grenzen werden gezeigt, Formeln zur Lateralauflösung und zur Erfassung von Phasensprüngen sowie Profilhöhen-Übertragungsfunktionen werden diskutiert.Item Open Access Optical methods of measuring rough surfaces(1989) Leonhardt, Klaus; Rippert, Karl-Heinz; Tiziani, Hans J.The statistical parameters of surfaces to be measured for industrial applications vary over several orders of magnitude. Surfaces with large slopes or edges are particularly difficult to be recorded. Some measuring methods developed in our laboratory are compared and the range of applications are discussed. For polished and fine ground glass and metal surfaces a heterodyne profilometer with a vertical resolution of 0.5 nm, lateral resolution of 0.6 μm, and large scanning length is discussed. The interferometer can be changed from single- to double-pass operation by rotation of a quarter-wave-plate. For rougher surfaces a profilometer of the photometric-balance type with resolution Rq < 4 nm and dynamic range of 20 μm and an interference microscope with automated fringe evaluation is described. An integral white light roughness sensor covers the roughness range 0.04μm to 10μm and measures independently mean roughness and autocorrelation width.Item Open Access Dual wavelength heterodyne interferometry for rough surface measurements(1990) Fischer, Edgar; Sodnik, Zoran; Ittner, Thomas; Tiziani, Hans J.For interferometric topography measurements of optically rough surfaces dual wavelength heterodyne Interferometry (DWHI) is a powerful tool. A DWHI system based on a two-wavelength HeNe laser and a matched grating technique is described. This set-up improves system stability and simple heterodyne frequency generation.Item Open Access Meeting the optical talent needs of industry in Europe(1989) Tiziani, Hans J.The thematic "meeting the optical talent needs of industry in Europe" can be looked at from different points of view. In the present report the industrial activities and the education in optics are summarized. My colleagues of the "Institut d'Optique" in Paris and the Imperial College in London will report on the curriculum in optics in Paris and London. The emphasis is more on the model we use at the University of Stuttgart. It is a particular engineering curriculum forming engineers with a good optics background.Item Open Access Verfahren zur optischen Rauheitsmessung und Mikroprofilometrie(1985) Leonhardt, Klaus; Rippert, Karl-Heinz; Tiziani, Hans J.In diesem Beitrag werden wegen der Kürze der Darstellung nur einige der bekannten Verfahren behandelt. Zwei Verfahren der Mikroprofilometrie, die im Institut für Technische Optik Stuttgart zur Zeit bearbeitet werden und ein Verfahren der integralen Rauheitsmessung, das in unserem Institut entwickelt wurde, werden ausführlicher beschrieben.Item Open Access New light valve based in photoinduced space charge fields in BSO-crystals(1987) Tiziani, Hans J.; Höller, FrankThe combined photoelectric and electrooptic properties of the BSO-crystal lead to a new possibility of realizing a real time spatial light modulator. Under certain geometrical conditions the crystal becomes birefringent in dependence on the local illuminance. Together with a suitable polarizer setup the crystal works as well as an incoherent to coherent converter as for contrast inversion.Item Open Access Remote nondestructive material analysis by photothermal interferometry(1987) Sodnik, Zoran; Tiziani, Hans J.Interferometry is used for the detection of thermal waves to study material properties. A symmetrical interferometer as thermal expansion detector was developed for photothermal nondestructive material analysis. After mixing a phase shifted reference signal electrically to the interferometer signal, phase and amplitude exchange phenomena have been observed.
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