Please use this identifier to cite or link to this item: http://dx.doi.org/10.18419/opus-4324
Authors: Sodnik, Zoran
Tiziani, Hans J.
Title: Remote nondestructive material analysis by photothermal interferometry
Issue Date: 1987
metadata.ubs.publikation.typ: Konferenzbeitrag
metadata.ubs.publikation.source: European Conference on Optics, Optical Systems and Applications 1986 : 30 Sept. - 3 Oct. 1986, Firenze, Italy. Bellingham, Wash. : SPIE, 1987 (Proceedings / SPIE 701). - ISBN 0-89252-736-6, S. 259-262
URI: http://nbn-resolving.de/urn:nbn:de:bsz:93-opus-61011
http://elib.uni-stuttgart.de/handle/11682/4341
http://dx.doi.org/10.18419/opus-4324
Abstract: Interferometry is used for the detection of thermal waves to study material properties. A symmetrical interferometer as thermal expansion detector was developed for photothermal nondestructive material analysis. After mixing a phase shifted reference signal electrically to the interferometer signal, phase and amplitude exchange phenomena have been observed.
Appears in Collections:07 Fakultät Konstruktions-, Produktions- und Fahrzeugtechnik

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