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dc.contributor.authorTiziani, Hans J.de
dc.date.accessioned2011-02-25de
dc.date.accessioned2016-03-31T08:16:26Z-
dc.date.available2011-02-25de
dc.date.available2016-03-31T08:16:26Z-
dc.date.issued1988de
dc.identifier.other36618699Xde
dc.identifier.urihttp://nbn-resolving.de/urn:nbn:de:bsz:93-opus-61137de
dc.identifier.urihttp://elib.uni-stuttgart.de/handle/11682/4353-
dc.identifier.urihttp://dx.doi.org/10.18419/opus-4336-
dc.description.abstractProgress has been made in the fringe analysing procedures. At last interferometry, holography and speckle techniques are more frequently applied in industry and become a powerful tool for engineering applications. The methods will be even more frequently applied in industry, when they can be applied in real time. In speckle interferometry the speckle size can be adapted to the photoelectric detector. In nondestructive testing with holographic or speckle techniques, in addition to the automatic fringe analysis the computation of the corresponding deformation and strain needs to be further improved. Furthermore, real time storage materials, rugged and reliable lasers and holographic components are needed to make the holographic methods for nondestructive testing even more attractive for the industry.en
dc.language.isoende
dc.rightsinfo:eu-repo/semantics/openAccessde
dc.subject.classificationHolographische Interferometrie , Speckle-Interferometriede
dc.subject.ddc530de
dc.titleFringe analysis in holography with BSO applicationsen
dc.typeconferenceObjectde
dc.date.updated2012-05-31de
ubs.fakultaetFakultät Konstruktions-, Produktions- und Fahrzeugtechnikde
ubs.institutInstitut für Technische Optikde
ubs.opusid6113de
ubs.publikation.sourceSmigielski, Paul (Hrsg.): Data processing and interpretation in holography : proceedings; 2nd Franco-German Congress on Applications of Holography; November 24-25, 1988, Saint-Louis, France. Saint-Louis, 1988, S. 79-93de
ubs.publikation.typKonferenzbeitragde
Enthalten in den Sammlungen:07 Fakultät Konstruktions-, Produktions- und Fahrzeugtechnik

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