07 Fakultät Konstruktions-, Produktions- und Fahrzeugtechnik

Permanent URI for this collectionhttps://elib.uni-stuttgart.de/handle/11682/8

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Institute: search.filters.UBSInstitut.Sonstige EinrichtungAuthor: search.filters.author.Tiziani, Hans J.

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    A combined distance and surface profile measurement system for industrial applications : a european project
    (1994) Docchio, Franco; Perini, Umberto; Tiziani, Hans J.
    The paper reports the design, development and characterization of an electrooptical equipment suitable for distance measurements and three-dimensional gauging of surfaces of industrial interest. The equipment comprises a dual-wavelength heterodyne interferometer for absolute distance measurements with a range of 20 m and an accuracy of 0.1 mm, that is integrated with a macroscopic scale, adaptive profilometer for threedimensional measurement of the shape to 1 mm. The performance of the equipment is well suited for effective operation in industrial metrology. The equipment has been developed by three partners, namely the Dipartimento di Elettronica per I’Automarione of the University of Brescia, the Sezione Diagnostica Elettroottica of ClSE, Milan, and the lnstitut for technische Optik of the University of Stuttgart, in the framework of a European Project partially funded by the Community Bureau of Reference.
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    Phase shifting in an oblique incidence interferometer
    (1991) Boebel, Doris; Packroß, Bernd; Tiziani, Hans J.
    The evaluation of the interference pattern of a prism interferometer by a phase-stepping technique is described. The required phase shift is achieved by moving the surface under test perpendicular to the hypotenuse of the prism. Limits of this phase-shifting technique are discussed. A calibration method of the phase shift between the interferograms for the adjustable sensitivity of the interferometer is shown. Finally measurements of technical surfaces are presented.
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    Determination of average roughness and profile autocorrelation width of metallic surfaces with a white light sensor
    (1984) Leonhardt, Klaus; Kaufmann, Ekkehart; Tiziani, Hans J.
    A new procedure to determine simultaneously a horizontal descriptor of the surface - the autocorrelation width - and the most important vertical descriptor - the root-mean-square roughness - is presented. It is based on the inversion of an analytic contrast formula. After a short introduction to white light random phase contrast measurement we describe the elimination process and show first experimental verifications.
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    Contouring using two-wavelength electronic speckle pattern interferometry employing dual-beam illuminations
    (1992) Diao, Hongyan; Peng, Xiang; Zou, Yunlu; Tiziani, Hans J.; Chen, L.
    Es wird eine neue Konturing-Methode mit einer elektronischen Zweiwellenlängen-Speckle-Interferometrie (TWESPI) vorgeschlagen, bei der zwei Beleuchtungsstrahlen verwendet werden. Die optisch rauhe Oberfläche wird bei einer synthetischen längeren equivalenten Wellenlänge vermessen, so daß durch die Änderung der Wellenlängen eine variable Meßempfindlichkeit erhalten werden kann. Dadurch erweitert diese Technik den Meßbereich der Einwellen-Speckle-Interferometrie und erlaubt die Messung von Konturen steiler Profile als bisher mit der Einwellenlängen-Methode möglich war.
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    Dual-wavelength interferometer for surface profile
    (1990) Manhart, Sigmund; Maurer, R.; Tiziani, Hans J.; Sodnik, Zoran; Fischer, Edgar; Mariani, A.; Bonsignori, R.; Margheri, Giancarlo; Giunti, C.; Zatti, Stefano
    The design and first experimental results of a dual-wavelength heterodyne interferometer (DWHI) for precise surface profile measurements are presented. The DWHI is based on a Mach-Zehnder type interferometer with the surface to be measured in the sensing arm of the interferometer. Two adjacent wavelengths are simultaneously used in the interferometer; the range information is gained from the beat frequency of both heterodyne interferometer signals. Thus, the extreme range ambiguity of classical interferometers and their sensitivity to mechanical distortions are reduced by the ratio of laser frequency to beat frequency. The DWHI is expected to have the good SIN performance a of coherent detection system but also the capability of measuring to diffusely scattering targets. The main features of the system presented here are: - use of a single diode laser in combination with a high frequency Bragg cell to generate two adjacent wavelengths - use of an all-fiber concept for the optomechanical build-up