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Issue DateTitleAuthor(s)
1994Double heterodyne interferometer using a multimode laser diodeHan, Sen; Dalhoff, Ernst; Fischer, Edgar; Kreuz, Silke; Tiziani, Hans J.
1990Dual wavelength heterodyne interferometry for rough surface measurementsFischer, Edgar; Sodnik, Zoran; Ittner, Thomas; Tiziani, Hans J.
1993Interferometry for high resolution absolute distance measuring by larger distancesDalhoff, Ernst; Fischer, Edgar; Kreuz, Silke; Tiziani, Hans J.
1992Heterodynverfahren für hochgenaue Vermessung im NahbereichFischer, Edgar; Ittner, Thomas; Sodnik, Zoran; Tiziani, Hans J.
1992Doppelheterodyn-Interferometrie für hochgenaue Vermessung im NahbereichFischer, Edgar; Dalhoff, Ernst; Ittner, Thomas; Sodnik, Zoran; Tiziani, Hans J.
1992Dual wavelength heterodyne interferometry using a matched grating set-upFischer, Edgar; Ittner, Thomas; Dalhoff, Ernst; Sodnik, Zoran; Tiziani, Hans J.
1993Double heterodyne interferometry for high precision distance measurementsDalhoff, Ernst; Fischer, Edgar; Kreuz, Silke; Tiziani, Hans J.
1990Dual-wavelength interferometer for surface profileManhart, Sigmund; Maurer, R.; Tiziani, Hans J.; Sodnik, Zoran; Fischer, Edgar; Mariani, A.; Bonsignori, R.; Margheri, Giancarlo; Giunti, C.; Zatti, Stefano
1993Two wavelength heterodyne absolute ranging technique using suppressed carrier modulationFischer, Edgar; Dalhoff, Ernst; Ittner, Thomas; Kreuz, Silke; Tiziani, Hans J.
1991Two-wavelength double heterodyne interferometry using a matched grating techniqueSodnik, Zoran; Fischer, Edgar; Ittner, Thomas; Tiziani, Hans J.