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Issue DateTitleAuthor(s)
1990Contouring by electronic speckle pattern interferometry employing dual beam illuminationJoenathan, Charles; Pfister, Berthold P.; Tiziani, Hans J.
1990Dual wavelength heterodyne interferometry for rough surface measurementsFischer, Edgar; Sodnik, Zoran; Ittner, Thomas; Tiziani, Hans J.
1990Triangulationssensoren für RoboteranwendungenSeitz, Günther; Jahn, Gerald; Tiziani, Hans J.
1990Einsatz computergenerierter HologrammeTiziani, Hans J.
1990Fotorefraktive Kristalle und weitere SpeichermedienTiziani, Hans J.
1990Dual-wavelength interferometer for surface profileManhart, Sigmund; Maurer, R.; Tiziani, Hans J.; Sodnik, Zoran; Fischer, Edgar; Mariani, A.; Bonsignori, R.; Margheri, Giancarlo; Giunti, C.; Zatti, Stefano
1990Oberflächenmesstechnik mit optischen VerfahrenTiziani, Hans J.
1990Self-induced photorefractive spatial frequency filterMöbus, Günter; Schmidt, B.; Tiziani, Hans J.

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