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Results 1-10 of 14 (Search time: 0.002 seconds).
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Issue DateTitleAuthor(s)
1992High precision laser supported close range distance measurementsTiziani, Hans J.
1992Contouring by electronic speckle pattern interferometry with quadruple-beam illuminationZou, Yunlu; Diao, Hongyan; Peng, Xiang; Tiziani, Hans J.
1992Contouring using two-wavelength electronic speckle pattern interferometry employing dual-beam illuminationsDiao, Hongyan; Peng, Xiang; Zou, Yunlu; Tiziani, Hans J.; Chen, L.
1992Heterodynverfahren für hochgenaue Vermessung im NahbereichFischer, Edgar; Ittner, Thomas; Sodnik, Zoran; Tiziani, Hans J.
1992A simplified multi-wavelength ESPI contouring technique based on a diode laser systemPeng, Xiang; Zou, Yunlu; Diao, Hongyan; Tiziani, Hans J.
1992Contouring by modified dual-beam ESPI based on tilting illumination beamsPeng, Xiang; Diao, Hongyan; Zou, Yunlu; Tiziani, Hans J.
1992Geometry for contouring by electronic speckle pattern interferometry based on shifting illumination beamsZou, Yunlu; Diao, Hongyan; Peng, Xiang; Tiziani, Hans J.
1992Optische und optoelektronische Verfahren zur dimensionellen VermessungTiziani, Hans J.
1992Doppelheterodyn-Interferometrie für hochgenaue Vermessung im NahbereichFischer, Edgar; Dalhoff, Ernst; Ittner, Thomas; Sodnik, Zoran; Tiziani, Hans J.
1992Dual wavelength heterodyne interferometry using a matched grating set-upFischer, Edgar; Ittner, Thomas; Dalhoff, Ernst; Sodnik, Zoran; Tiziani, Hans J.

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