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Issue Date	Title	Author(s)
1990	Contouring by electronic speckle pattern interferometry employing dual beam illumination	Joenathan, Charles; Pfister, Berthold P.; Tiziani, Hans J.
1992	Contouring by electronic speckle pattern interferometry with quadruple-beam illumination	Zou, Yunlu; Diao, Hongyan; Peng, Xiang; Tiziani, Hans J.
1990	Dual wavelength heterodyne interferometry for rough surface measurements	Fischer, Edgar; Sodnik, Zoran; Ittner, Thomas; Tiziani, Hans J.
1993	Interferometry for high resolution absolute distance measuring by larger distances	Dalhoff, Ernst; Fischer, Edgar; Kreuz, Silke; Tiziani, Hans J.
1988	Anwendung der synthetischen Holografie in der Meßtechnik	Tiziani, Hans J.
1993	Resolution limits of active triangulation systems by defocusing	Seitz, Günther; Tiziani, Hans J.
1983	Holographic interferometry and speckle metrology : a review of the present state	Tiziani, Hans J.
1983	Applications of interferometry for testing macro/microgeometry of optical surfaces	Tiziani, Hans J.
1988	Fringe analysis in holography with BSO applications	Tiziani, Hans J.
1992	Contouring using two-wavelength electronic speckle pattern interferometry employing dual-beam illuminations	Diao, Hongyan; Peng, Xiang; Zou, Yunlu; Tiziani, Hans J.; Chen, L.