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Issue DateTitleAuthor(s)
1982Removing ambiguities in surface roughness measurementLeonhardt, Klaus; Tiziani, Hans J.
1980Real-time displacement and tilt analysis by a speckle technique using Bi12SiO20-crystalsTiziani, Hans J.; Leonhardt, Klaus; Klenk, Jürgen
1985Verfahren zur optischen Rauheitsmessung und MikroprofilometrieLeonhardt, Klaus; Rippert, Karl-Heinz; Tiziani, Hans J.
1983Temperature induced deformations in BSO crystals due to photoconductivityLeonhardt, Klaus; Tiziani, Hans J.
1989Mikro-Profilometrie zur Bestimmung der Topographie und Rauheit technischer Oberflächen mittels Heterodyn-LaserinterferometrieLeonhardt, Klaus; Rippert, Karl-Heinz; Tiziani, Hans J.
1989Optical methods of measuring rough surfacesLeonhardt, Klaus; Rippert, Karl-Heinz; Tiziani, Hans J.
1984Determination of average roughness and profile autocorrelation width of metallic surfaces with a white light sensorLeonhardt, Klaus; Kaufmann, Ekkehart; Tiziani, Hans J.
1987Optische Mikroprofilometrie und RauheitsmessungLeonhardt, Klaus; Rippert, Karl-Heinz; Tiziani, Hans J.
1980Holography and speckle techniques for real time displacement deformation and vibration analysisTiziani, Hans J.; Klenk, Jürgen; Leonhardt, Klaus

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