1. OPUS

Auflistung nach Institut Institut für Technische Optik

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ErscheinungsdatumTitelAutor(en)
1983Beitrag zur Verwendung von Zernike-Polynomen bei der automatischen InterferenzstreifenauswertungKüchel, Michael; Schmieder, Thomas; Tiziani, Hans J.
1983Berührungslose optische EchtzeitmesstechnikTiziani, Hans J.
1993Beurteilung der Wellenfront von CO2-Lasern mittels phase retrivalHembd, Christian; Tiziani, Hans J.
2015Ein bildgebendes Quantenkaskadenlaser-Spektrometer zur intraoperativen Gewebedifferenzierung in der chirurgischen OnkologieGeiger, Florian Benedikt
2009Black box : an implementation using lasers, smoke and fluorescenceHaist, Tobias; Knoll, Ralf; Lorenz, Andreas
1992Calibration of the inclined contour planes formed on ESPI and optimization of ESPI optical system for contouringDiao, Hongyan; Zou, Yunlu; Peng, Xiang; Tiziani, Hans J.; Chen, L.
1993Collimating laser diodes with hybrid opticsHaupt, Christoph; Jäger, Ernst; Rothe, Andreas; Daffner, Michael; Tiziani, Hans J.
1994A combined distance and surface profile measurement system for industrial applications : a european projectDocchio, Franco; Perini, Umberto; Tiziani, Hans J.
1988A comparison of methods to measure the modulation transfer function of aerial survey lens systems from the image structuresLei, Fang; Tiziani, Hans J.
1992Computer synchronized 3D-triangulation sensor for robot visionWieland, Paul; Tiziani, Hans J.
1994Contouring by electronic speckle pattern interferometry employing divergent dual beam illuminationZou, Yunlu; Pedrini, Giancarlo; Tiziani, Hans J.
1990Contouring by electronic speckle pattern interferometry employing dual beam illuminationJoenathan, Charles; Pfister, Berthold P.; Tiziani, Hans J.
1992Contouring by electronic speckle pattern interferometry with quadruple-beam illuminationZou, Yunlu; Diao, Hongyan; Peng, Xiang; Tiziani, Hans J.
1992Contouring by modified dual-beam ESPI based on tilting illumination beamsPeng, Xiang; Diao, Hongyan; Zou, Yunlu; Tiziani, Hans J.
1992Contouring using two-wavelength electronic speckle pattern interferometry employing dual-beam illuminationsDiao, Hongyan; Peng, Xiang; Zou, Yunlu; Tiziani, Hans J.; Chen, L.
1987Current state of optical testingTiziani, Hans J.
2022Data-driven identification of biomarkers for in situ monitoring of drug treatment in bladder cancer organoidsBecker, Lucas; Fischer, Felix; Fleck, Julia L.; Harland, Niklas; Herkommer, Alois; Stenzl, Arnulf; Aicher, Wilhelm K.; Schenke-Layland, Katja; Marzi, Julia
2022Depth from axial differential perspectiveFaulhaber, Andreas; Krächan, Clara; Haist, Tobias
1994Derivatives obtained directly from displacement dataZou, Yunlu; Pedrini, Giancarlo; Tiziani, Hans J.
1993Design consideration of a dual-beam ESPI optical system for contouringDiao, Hongyan; Zou, Yunlu; Tiziani, Hans J.
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